Yield Optimization by Design Centering and Worst-Case Distance Analysis. - G. S. Samudra; H. M. Chen; D. S. H. Chan; Yaacob Ibrahim (ICCD, 1999)

Global optimization for digital MOS circuits performance. - H. M. Chen; G. S. Samudra; D. S. H. Chan; Yaacob Ibrahim (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000)

A new approach for eliminating unwanted patterns in attenuated phase shift masks. - Moitreyee Mukherjee-Roy; Navab Singh; Sohan Singh Mehta; G. S. Samudra (Microelectron. J., 2003)