A pragmatic methodology for the monitoring of the electronic components ageing: The case of power thyristors at EDF. - G. Simon; G. Guffroy (Microelectron. Reliab., 2001)

Which interconnects for which 3D applications? Status and perspectives. - Yann Lamy; Jean-Philippe Colonna; G. Simon; Patrick Leduc; Séverine Cheramy; C. Laviron (3DIC, 2013)