RF stress effects on CMOS LC-loaded VCO reliability evaluated by experiments. - H. D. Yen; Jiann-Shiun Yuan; Ruey-Lue Wang; G. W. Huang; W. K. Yeh; F. S. Huang (Microelectron. Reliab., 2012)

Experimental evaluation of hot electron reliability on differential Clapp-VCO. - S. L. Jang; Jiann-Shiun Yuan; S. D. Yen; E. Kritchanchai; G. W. Huang (Microelectron. Reliab., 2013)