SONOS-Type Flash Memory with HfO2 Thinner than 4 nm as Trapping Layer Using Atomic Layer Deposition. - Jae Sub Oh; Kwang Il Choi; Young Su Kim; Min Ho Kang; Myeong Ho Song; Sung Kyu Lim; Dong Eun Yoo; Jeong Gyu Park; Hi Deok Lee; Ga Won Lee 001 (IEICE Trans. Electron., 2010)

Dual-Gate ZnO Thin-Film Transistors with SiNx as Dielectric Layer. - Young Su Kim; Min Ho Kang; Kang Suk Jeong; Jae Sub Oh; Yu Mi Kim; Dong Eun Yoo; Hi Deok Lee; Ga Won Lee 001 (IEICE Trans. Electron., 2011)

Comparative Analysis of Bandgap-Engineered Pillar Type Flash Memory with HfO2 and S3N4 as Trapping Layer. - Sang-Youl Lee; Seung-Dong Yang; Jae-Sub Oh; Ho-Jin Yun; Kwang-Seok Jeong; Yu-Mi Kim; Hi-Deok Lee; Ga-Won Lee 001 (IEICE Trans. Electron., 2012)

Reliability Analysis by Charge Migration of 3D SONOS Flash Memory. - Jun-Kyo Jeong; Jae-Young Sung; Hee-Hun Yang; Hi-Deok Lee; Ga-Won Lee 001 (IRPS, 2020)

Investigation of Random Telegraph Noise Characteristics with Intentional Hot Carrier Aging. - Hyeong-Sub Song; Sunil Babu Eadi; Hyun-Dong Song; Hyun-Woong Choi; Ga-Won Lee 001; Hi-Deok Lee (IRPS, 2020)

Bottom-Gated ZnO TFT Pressure Sensor with 1D Nanorods. - Ki-Nam Kim; Woon-San Ko; Jun-Ho Byun; Do-Yeon Lee; Jun-Kyo Jeong; Hi-Deok Lee; Ga-Won Lee 001 (Sensors, 2022)

Epitaxial Strain Control of HfxZr1-xO2 with Sub-nm IGZO Seed Layer Achieving EOT=0.44 nm for DRAM Cell Capacitor. - Seongho Kim; Young-Keun Park; Gyu Soup Lee; Eui Joong Shin; Woon-San Ko; Hi Deok Lee; Ga-Won Lee 001; Byung Jin Cho (VLSI Technology and Circuits, 2023)