Comparing line and AST granularity level for program repair using PyGGI. - Gabin An; Jinhan Kim; Shin Yoo (GI@ICSE, 2018)

PyGGI 2.0: language independent genetic improvement framework. - Gabin An; Aymeric Blot; Justyna Petke; Shin Yoo (ESEC/SIGSOFT FSE, 2019)

Amortising the Cost of Mutation Based Fault Localisation using Statistical Inference. - Jinhan Kim; Gabin An; Robert Feldt; Shin Yoo (CoRR, 2019)

The State and Future of Genetic Improvement. - William B. Langdon; Westley Weimer; Christopher Steven Timperley; Oliver Krauss; Zhen Yu Ding; Yiwei Lyu; Nicolas Chausseau; Eric M. Schulte; Shin Hwei Tan; Kevin Leach; Yu Huang 015; Gabin An (ACM SIGSOFT Softw. Eng. Notes, 2019)

Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study. - Jeongju Sohn; Gabin An; Jingun Hong; Dongwon Hwang; Shin Yoo (ICST, 2021)

Ahead of Time Mutation Based Fault Localisation using Statistical Inference. - Jinhan Kim; Gabin An; Robert Feldt; Shin Yoo (ISSRE, 2021)

Reducing the search space of bug inducing commits using failure coverage. - Gabin An; Shin Yoo (ESEC/SIGSOFT FSE, 2021)

Searching for Multi-fault Programs in Defects4J. - Gabin An; Juyeon Yoon; Shin Yoo (SSBSE, 2021)

Human-in-the-Loop Fault Localisation Using Efficient Test Prioritisation of Generated Tests. - Gabin An; Shin Yoo (CoRR, 2021)

Improving Test Distance for Failure Clustering with Hypergraph Modelling. - Gabin An; Juyeon Yoon; Joyce Jiyoung Whang; Shin Yoo (CoRR, 2021)

Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA. - Gabin An; Juyeon Yoon; Jeongju Sohn; Jingun Hong; Dongwon Hwang; Shin Yoo (ICSE (SEIP), 2022)

FDG: a precise measurement of fault diagnosability gain of test cases. - Gabin An; Shin Yoo (ISSTA, 2022)

Fonte: Finding Bug Inducing Commits from Failures. - Gabin An; Jingun Hong; Naryeong Kim; Shin Yoo (ICSE, 2023)

BUGSC++: A Highly Usable Real World Defect Benchmark for C/C++. - Gabin An; Minhyuk Kwon; Kyunghwa Choi; Jooyong Yi; Shin Yoo (ASE, 2023)

A Preliminary Evaluation of LLM-Based Fault Localization. - Sungmin Kang; Gabin An; Shin Yoo (CoRR, 2023)

Learning test-mutant relationship for accurate fault localisation. - Jinhan Kim; Gabin An; Robert Feldt; Shin Yoo (Inf. Softw. Technol., 2023)

Genetic Improvement @ ICSE 2023. - William B. Langdon; Vesna Nowack; Justyna Petke; Markus Wagner 007; Hyeonseok Lee; Erik M. Fredericks; Gabin An; Aymeric Blot (ACM SIGSOFT Softw. Eng. Notes, 2023)

Just-in-Time Flaky Test Detection via Abstracted Failure Symptom Matching. - Gabin An; Juyeon Yoon; Thomas Bach 001; Jingun Hong; Shin Yoo (ICSME, 2024)

A Quantitative and Qualitative Evaluation of LLM-Based Explainable Fault Localization. - Sungmin Kang; Gabin An; Shin Yoo (Proc. ACM Softw. Eng., 2024)

The 13th International Workshop on Genetic Improvement(GI @ ICSE 2024). - William B. Langdon; Gabin An; Aymeric Blot; Vesna Nowack; Justyna Petke; Shin Yoo; Oliver Krauss; Erik M. Fredericks; Daniel Blackwell (ACM SIGSOFT Softw. Eng. Notes, 2024)

Lachesis: Predicting LLM Inference Accuracy using Structural Properties of Reasoning Paths. - Naryeong Kim; Sungmin Kang; Gabin An; Shin Yoo (DeepTest, 2025)

Evaluating Machine Learning-Based Test Case Prioritization in the Real World: An Experiment with SAP HANA. - Jeongki Son; Gabin An; Jingun Hong; Shin Yoo (ICST, 2025)

COSMosFL: Ensemble of Small Language Models for Fault Localisation. - Hyunjoon Cho; Sungmin Kang; Gabin An; Shin Yoo (LLM4Code@ICSE, 2025)

Metamon: Finding Inconsistencies between Program Documentation and Behavior using Metamorphic LLM Queries. - Hyeonseok Lee; Gabin An; Shin Yoo (LLM4Code@ICSE, 2025)

Identifying Bug Inducing Commits by Combining Fault Localisation and Code Change Histories. - Gabin An; Jinsu Choi; Jingun Hong; Naryeong Kim; Shin Yoo (CoRR, 2025)