Increasing the efficiency of analog OBIST using on-chip compensation of technology variations. - Daniel Arbet; Juraj Brenkus; Gábor Gyepes; Viera Stopjaková (DDECS, 2011)

Comparison of iddt test efficiency in covering opens in SRAMs realised in two different technologies. - Gábor Gyepes; Juraj Brenkus; Daniel Arbet; Viera Stopjaková (DDECS, 2011)

OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters. - Daniel Arbet; Gábor Gyepes; Juraj Brenkus; Viera Stopjaková (DDECS, 2012)

Application of IDDT test towards increasing SRAM reliability in nanometer technologies. - Gábor Gyepes; Daniel Arbet; Juraj Brenkus; Viera Stopjaková (DDECS, 2012)

Efficiency of oscillation-based BIST in 90nm CMOS active analog filters. - Daniel Arbet; Gabriel Nagy; Viera Stopjaková; Gábor Gyepes (DDECS, 2013)

Numerical method for DC fault analysis simplification and simulation time reduction. - Juraj Brenkus; Viera Stopjaková; Gábor Gyepes (DDECS, 2013)

A novel impedance calculation method and its time efficiency evaluation. - Juraj Brenkus; Viera Stopjaková; Daniel Arbet; Gábor Gyepes; Libor Majer (DDECS, 2014)

A new IDDT test approach and its efficiency in covering resistive opens in SRAM arrays. - Gábor Gyepes; Viera Stopjaková; Daniel Arbet; Libor Majer; Juraj Brenkus (Microprocess. Microsystems, 2014)

BIST architecture for oscillation test of analog ICs and investigation of test hardware influence. - Daniel Arbet; Viera Stopjaková; Juraj Brenkus; Gábor Gyepes; Martin Kovác; Libor Majer (Microelectron. Reliab., 2014)

Intelligent Monitoring System for Universal Data Collection and Analysis. - Ondrej Kachman; Jakub Findura; Marcel Baláz; Gábor Gyepes; Libor Majer; Marian Vojs (RADIOELEKTRONIKA, 2022)