Comparing migratory resistive short formation abilities of conductor systems applied in advanced interconnection systems. - Gábor Harsányi; George Inzelt (Microelectron. Reliab., 2001)

Searching for appropriate humidity accelerated migration reliability tests methods. - P. Bojta; P. Németh; Gábor Harsányi (Microelectron. Reliab., 2002)

Fractal description of dendrite growth during electrochemical migration. - Csaba Dominkovics; Gábor Harsányi (Microelectron. Reliab., 2008)

3D thermal model to investigate component displacement phenomenon during reflow soldering. - Balázs Illés; Gábor Harsányi (Microelectron. Reliab., 2008)

Investigation of intermetallic compounds (IMCs) in electrochemically stripped solder joints with SEM. - Tamás Hurtony; Attila Bonyár; Péter Gordon; Gábor Harsányi (Microelectron. Reliab., 2012)

BME VIK Annual Research Report on Electrical Engineering and Computer Science 2016. - Hassan Charaf; Gábor Harsányi; András Poppe; Sándor Imre; Bálint Kiss; Tamás Dabóczi; Gyula Y. Katona; Lajos Nagy; Gábor Magyar; István Kiss (Period. Polytech. Electr. Eng. Comput. Sci., 2017)