Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technology. - Thomas Kuenzig; Gabriele Schrag; Jacopo Iannacci (Microelectron. Reliab., 2012)

Evaluation of thermal transient characterization methodologies for high-power LED applications. - Stefan Müller; Thomas Zahner; Frank Singer; Gabriele Schrag; Gerhard K. M. Wachutka (Microelectron. J., 2013)

High-Throughput Apparatus for Semiconductor Device Characterization in a Magnetic Field at Extreme High Temperatures. - Hesham Okeil; Gabriele Schrag; Gerhard K. M. Wachutka (IEEE Trans. Instrum. Meas., 2023)