Electric passivation of interface traps at drain junction space charge region in p-MOS transistors. - Gang Chen 022; Ming Fu Li; Ying Jin 010 (Microelectron. Reliab., 2001)

Interaction of interface-traps located at various sites in MOSFETs under stress. - Gang Chen 022; Ming Fu Li; Ying Jin 010 (IEEE Trans. Reliab., 2002)