Testing SSD Firmware with State Data-Aware Fuzzing: Accelerating Coverage in Nondeterministic I/O Environments. - Gangho Yoon; Eunseok Lee (CoRR, 2025)

Automating Code Generation for Semiconductor Equipment Control from Developer Utterances with LLMs. - Youngkyoung Kim; Sanghyeok Park; Misoo Kim; Gangho Yoon; Eunseok Lee; Simon S. Woo (CoRR, 2025)