Uncertainty Analysis of Stray Field Measurements by Quantitative Magnetic Force Microscopy. - Xiukun Hu; Gaoliang Dai; Sibylle Sievers; Alexander Fernández Scarioni; Volker Neu; Mark Bieler; Hans Werner Schumacher (IEEE Trans. Instrum. Meas., 2020)

True 3D Nanometrology: 3D-Probing with a Cantilever-Based Sensor. - Jan Thiesler; Thomas Ahbe; Rainer Tutsch; Gaoliang Dai (Sensors, 2022)