A Hybrid Deep Learning-Based Framework for Chip Packaging Fault Diagnostics in X-Ray Images. - Jie Wang 142; Gaomin Li; Haoyu Bai; Guixin Yuan; Xuan Li; Bin Lin; Lijun Zhong; Xiaohu Zhang (IEEE Trans. Ind. Informatics, 2024)

CXR-AD: Component X-ray Image Dataset for Industrial Anomaly Detection. - Haoyu Bai; Jie Wang; Gaomin Li; Xuan Li; Xiaohu Zhang; Xia Yang (CoRR, 2025)