Self-compliance and high-performance GeTe-based CBRAM with Cu electrode. - Jiayi Zhao; Qin Chen; Xiaohu Zhao; Gaoqi Yang; Guokun Ma; Hao Wang (Microelectron. J., 2023)

Investigation and Mitigation of Transistor Induced Reliability Issues in 40NM RRAM Array. - Yuhang Yang; Zongwei Wang 001; Haoran Wang; Lin Bao; Gaoqi Yang; Yimao Cai; Ru Huang 001 (IRPS, 2025)