Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults. - Gary L. Craig; Charles R. Kime (ITC, 1985)

Test Scheduling and Control for VLSI Built-In Self-Test. - Gary L. Craig; Charles R. Kime; Kewal K. Saluja (IEEE Trans. Computers, 1988)

Clustering: Composition for Active Object Systems. - Umesh Bellur; Gary L. Craig; Kevin Shank; Doug Lea (HICSS (2), 1994)

A Path to Scalability and Efficient Performance. - Charles K. Shank; Gary L. Craig; Doug Lea (LCR, 1995)