Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns. - Gaurav Bhargava; Dale Meehl; James Sage (ITC, 2007)

Systematic Hold-time Fault Diagnosis and Failure Debug in Production Chips. - Chih-Yan Liu; Mu-Ting Wu; James Chien-Mo Li; Gaurav Bhargava; Chris Nigh (ATS, 2020)

AAA: Automated, On-ATE AI Debug of Scan Chain Failures. - Chris Nigh; Gaurav Bhargava; Ronald D. Blanton (ITC, 2021)

Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization. - Mu-Ting Wu; Cheng-Sian Kuo; James Chien-Mo Li; Chris Nigh; Gaurav Bhargava (ITC, 2021)

Using Custom Fault Models to Improve Understanding of Silicon Failures. - Subhadip Kundu; Gaurav Bhargava; Lesly Endrinal; Lavakumar Ranganathan (ITC, 2022)

Diagnosing Double Faulty Chains through Failing Bit Separation. - Cheng-Sian Kuo; Bing-Han Hsieh; James Chien-Mo Li; Chris Nigh; Gaurav Bhargava; Mason Chern (ITC, 2022)

Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis. - Bing-Han Hsieh; Yun-Sheng Liu; James Chien-Mo Li; Chris Nigh; Mason Chern; Gaurav Bhargava (ITC, 2023)

Design and Validation of a Microstrip Log-Periodic Feedline-Based Filter for Microwave Imaging of Rebar. - Amartya Paul; Gaurav Bhargava; Dibyendu Adak; Subhrajit Dutta; Shubhankar Majumdar (IEEE Trans. Instrum. Meas., 2024)

Non-Destructive Evaluation of Strength and Porosity of Bituminous Mixes Using Log- Periodic Feedlines-Based Ring Filter. - Amartya Paul; Gaurav Bhargava; Pradeep Kumar Gautam; Shubhankar Majumdar (IEEE Trans. Instrum. Meas., 2024)