Deep Learning based MURA Defect Detection. - Ramya Bagavath Singh; Gaurav Kumar; Gaurav Sultania; Shashank Shrikant Agashe; Priya Ranjan Sinha; Chulmoo Kang (EAI Endorsed Trans. Cloud Syst., 2019)

Quality Prediction in Semiconductors using Unlabeled Data from Multiple Channels. - Lakshmi N. Pedapudi; Gaurav Kumar; Shashank S. Agashe; Sathyanarayanan Kulasekaran; Gaurav Sultania (MSIE, 2021)