Effective Drive Current in Scaled FinFET and NSFET CMOS Inverters. - Ali Razavieh; Y. Deng; Peter Zeitzoff; M. R. Na; J. Frougier; Gauri Karve; D. E. Brown; T. Yamashita; Edward J. Nowak (DRC, 2018)

Time Dependent Dielectric Breakdown of Cobalt and Ruthenium Interconnects at 36nm Pitch. - H. Huang; P. S. McLaughin; James J. Kelly; C.-C. Yang; Richard G. Southwick; M. Wang; Griselda Bonilla; Gauri Karve (IRPS, 2019)

Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor. - Miaomiao Wang 006; Jingyun Zhang; Huimei Zhou; Richard G. Southwick; Robin Hsin Kuo Chao; Xin Miao; Veeraraghavan S. Basker; Tenko Yamashita; Dechao Guo; Gauri Karve; Huiming Bu; James H. Stathis (IRPS, 2019)

Wafer Level Pixelation of Colloidal Quantum Dot Image Sensors. - Yunlong Li; Gauri Karve; Pawel E. Malinowski; Joo Hyoung Kim; Epimitheas Georgitzikis; Vladimir Pejovic; Myung-Jin Lim; Luis Moreno Hagelsieb; Renaud Puybaret; Itai Lieberman; Jiwon Lee; David Cheyns; et al. (VLSI Technology and Circuits, 2022)

A Thin-Film Pinned-Photodiode Imager Pixel with Fully Monolithic Fabrication and beyond 1Me- Full Well Capacity. - Joo Hyoung Kim; François Berghmans; Abu Bakar Siddik; Irem Sutcu; Isabel Pintor Monroy; Jehyeok Yu; Tristan Weydts; Epimitheas Georgitzikis; Jubin Kang; Yannick Baines; Yannick Hermans; Naresh Chandrasekaran; et al. (Sensors, 2023)