An evaluation of accelerated failure time models of stress-migration and stress-induced voiding failures under vias. - Gavin D. R. Hall; Derryl D. J. Allman (IRPS, 2015)

Device reliability for CMOS image sensors with backside through-silicon vias. - Jeff Peter Gambino; H. Soleimani; I. Rahim; B. Riebeek; L. Sheng; G. Hosey; H. Truong; Gavin D. R. Hall; R. Jerome; D. Price (IRPS, 2018)

Reliability of an Al2O3/SiO2MIM Capacitor for 180nm (3.3V) Technology. - Jeff Gambino; Derryl D. J. Allman; Gavin D. R. Hall; D. Price; L. Sheng; R. Takada; Y. Kanuma (IRPS, 2019)

Studies of Bias Temperature Instabilities in 4H-SiC DMOSFETs. - Amartya Ghosh; Jifa Hao; Michael Cook 004; Chris Kendrick; Samia A. Suliman; Gavin D. R. Hall; Tom Kopley; Osama O. Awadelkarim (IRPS, 2020)

Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors. - Konner E. K. Holden; Gavin D. R. Hall; Michael Cook 004; Chris Kendrick; Kaitlyn Pabst; Bruce Greenwood; Robin Daugherty; Jeff P. Gambino; Derryl D. J. Allman (IRPS, 2021)