Testability of digital circuits via the spectral domain. - Brian R. Bannister; David R. Melton; Gaynor E. Taylor (ICCD, 1989)

Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits. - Ian M. Bell; Kevin R. Eckersall; Stephen J. Spinks; Gaynor E. Taylor (ISCAS, 1995)

Concurrent Self Test of Switched Current Circuits Based on the S2I-Technique. - Geir E. Sæther; Chris Toumazou; Gaynor E. Taylor; Kevin R. Eckersall; Ian M. Bell (ISCAS, 1995)

Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits. - José Machado da Silva; José Silva Matos; Ian M. Bell; Gaynor E. Taylor (J. Electron. Test., 1996)

Robust Data Compression for Analogue Test Outputs. - Aleksandra Rankov; Gaynor E. Taylor; John Webster (IOLTW, 2002)