Design for Testability: Using Scanpath Techniques for Path-Delay Test and Measurement. - Bulent I. Dervisoglu; Gayvin E. Stong (ITC, 1991)

Application of Scan-Based DFT Methodology for Detecting Static and Timing Failures in VLSI Components. - Bulent I. Dervisoglu; Gayvin E. Stong (VLSI, 1991)