Capacity vs. Availability Trade-offs in Mesh Restorable WDM Networks. - Geert Willems; Peter Arijs; Wim Van Parys; Piet Demeester (DRCN, 2001)

Modified micro-macro thermo-mechanical modelling of ceramic ball grid array packages. - Bart Vandevelde; Dominiek Degryse; Eric Beyne; Eric Roose; Dorina Corlatan; Guido Swaelen; Geert Willems; Filip Christiaens; Alcatel Bell; Dirk Vandepitte (Microelectron. Reliab., 2003)

As Time Flies By: Mixed Image and Model-Based Rendering of an Historical Landscape from Helicopter Images. - Maarten Vergauwen; Daniel Pletinckx; Geert Willems; Frank Verbiest; Luc Van Gool; Truus Helsen (VAST, 2004)

Real-Time Image Based Rendering from Uncalibrated Images. - Geert Willems; Frank Verbiest; Maarten Vergauwen; Luc Van Gool (3DIM, 2005)

Combining image and model based rendering of an archaeological site. - Maarten Vergauwen; Geert Willems; Frank Verbiest; Luc Van Gool; Daniel Pletinckx (Signal Process. Image Commun., 2005)

Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly. - Nele Van Steenberge; Paresh Limaye; Geert Willems; Bart Vandevelde; Inge Schildermans (Microelectron. Reliab., 2007)

An Efficient Dense and Scale-Invariant Spatio-Temporal Interest Point Detector. - Geert Willems; Tinne Tuytelaars; Luc Van Gool (ECCV (2), 2008)

Spatio-temporal features for robust content-based video copy detection. - Geert Willems; Tinne Tuytelaars; Luc Van Gool (Multimedia Information Retrieval, 2008)

Exemplar-based Action Recognition in Video. - Geert Willems; Jan Hendrik Becker; Tinne Tuytelaars; Luc Van Gool (BMVC, 2009)

Hough Transform and 3D SURF for Robust Three Dimensional Classification. - Jan Knopp; Mukta Prasad; Geert Willems; Radu Timofte; Luc Van Gool (ECCV (6), 2010)

Sn whisker evaluations in 3D microbumped structures. - George Vakanas; Björn Vandecasteele; David Schaubroeck; Joke De Messemaeker; Geert Willems; Mark Ashworth; Geoffrey D. Wilcox; Ingrid De Wolf (Microelectron. Reliab., 2014)

Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems. - Abdellatif Bey-Temsamani; S. Kauffmann; Y. Descas; Bart Vandevelde; Franco Zanon; Geert Willems (Microelectron. Reliab., 2017)

Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components. - Bart Vandevelde; Filip Vanhee; Davy Pissoort; Lieven Degrendele; Johan de Baets; Bart Allaert; Ralph Lauwaert; Franco Zanon; Riet Labie; Geert Willems (Microelectron. Reliab., 2017)