ESD protection circuit design for ultra-sensitive IO applications in advanced sub-90nm CMOS technologies. - Markus P. J. Mergens; Geert Wybo; Bart Keppens; Benjamin Van Camp; Frederic De Ranter; Koen G. Verhaege; John Armer; Phillip Jozwiak; Christian C. Russ (ISCAS (2), 2005)

SCR-based ESD protection in nanometer SOI technologies. - Olivier Marichal; Geert Wybo; Benjamin Van Camp; Pieter Vanysacker; Bart Keppens (Microelectron. Reliab., 2007)