Aliasing Probability in Multiple Input Linear Signature Automata for Q-ary Symmetric Errors. - Geetani Edirisooriya; John P. Robinson (ICCD, 1991)

Cyclic code weight spectra and BIST aliasing. - Geetani Edirisooriya; John P. Robinson (J. Electron. Test., 1991)

A signature efficient solution for remote file comparison. - Samantha Edirisooriya; Geetani Edirisooriya (COMPSAC, 1992)

Aliasing in Multiple-Valued Test Data Compaction. - Geetani Edirisooriya; John P. Robinson (ISMVL, 1992)

Design of low cost ROM based test generators. - Geetani Edirisooriya; John P. Robinson (VTS, 1992)

On the Performance of Augmented Signature Testing. - Geetani Edirisooriya; Samantha Edirisooriya; John P. Robinson (ISCAS, 1993)

A new built-in self-test method based on prestored testing. - Geetani Edirisooriya; Samantha Edirisooriya; John P. Robinson (VTS, 1993)

Time and space correlated errors in signature analysis. - Geetani Edirisooriya; Samantha Edirisooriya; John P. Robinson (VTS, 1993)

Aliasing properties of circular MISRs. - Geetani Edirisooriya; John P. Robinson (J. Electron. Test., 1993)

Test generation to minimize error masking. - Geetani Edirisooriya; John P. Robinson (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993)

Scan Chain Fault Diagnosis with Fault Dictionaries. - Geetani Edirisooriya; Samantha Edirisooriya (ISCAS, 1995)

Diagnosis of scan path failures. - Samantha Edirisooriya; Geetani Edirisooriya (VTS, 1995)

Authors' reply to comments on "Aliasing Properties of Circular MISRs". - Geetani Edirisooriya; John P. Robinson (J. Electron. Test., 1995)

Closed Form Aliasing Probability For Q-ary Symmetric Errors. - Geetani Edirisooriya (VLSI Design, 1996)