Device performance analysis on 20nm technology thin wafers in a 3D package. - Sukeshwar Kannan; Rahul Agarwal; Arnaud Bousquet; Geetha Aluri; Hui-Shan Chang (IRPS, 2015)

Attribute Similarity and Relevance-Based Product Schema Matching for Targeted Catalog Enrichment. - Evan Shieh; Saul Simhon; Geetha Aluri; Georgios Papachristoudis; Doa Yakut; Dhanya Raghu (ICBK, 2021)