An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint. - Geewhun Seok; Il-soo Lee; Tony Ambler; Baxter F. Womack (DFT, 2006)

Write-through method for embedded memory with compression Scan-based testing. - Geewhun Seok; Hong Kim; Baker Mohammad (VTS, 2012)