Design-for-Test Techniques for SoC Designs (Tutorial Abstract). - Geir Eide (ISQED, 2002)

Embedded Deterministic Test for Low-Cost Manufacturing Test. - Janusz Rajski; Jerzy Tyszer; Mark Kassab; Nilanjan Mukherjee 001; Rob Thompson; Kun-Han Tsai; Andre Hertwig; Nagesh Tamarapalli; Grzegorz Mrugalski; Geir Eide; Jun Qian (ITC, 2002)

Open Microphone - My DFT is better than yours ... - Geir Eide; Kenneth E. Posse (ITC, 2003)

Key Impediments to DFT-Focused Test and How to Overcome Them. - Kenneth E. Posse; Geir Eide (ITC, 2003)

ITC 2003 panels: Part 2. - Carol Stolicny; Mustapha Slamani; Fidel Muradali; Geir Eide; Mike Li (IEEE Des. Test Comput., 2004)

Employing the STDF V4-2007 Standard for Scan Test Data Logging. - Markus Seuring; Michael Braun; Alan Ma; Geir Eide; Kathy Yang; Huaxing Tang (IEEE Des. Test, 2012)

Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. - Shobhit Malik; Thomas Herrmann; Sriram Madhavan; Rao Desineni; Chris Schuermyer; Geir Eide (IEEE Des. Test, 2013)

Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data. - Wu-Tung Cheng; Randy Klingenberg; Brady Benware; Wu Yang; Manish Sharma; Geir Eide; Yue Tian; Sudhakar M. Reddy; Yan Pan; Sherwin Fernandes; Atul Chittora (ATS, 2017)

Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs. - Jean-François Côté; Mark Kassab; Wojciech Janiszewski; Ricardo Rodrigues 008; Reinhard Meier; Bartosz Kaczmarek; Peter Orlando; Geir Eide; Janusz Rajski; Glenn Colón-Bonet; Naveen Mysore; Ya Yin; et al. (ITC, 2020)

The Advancement of 1149.10. - Yu Huang; Haitao Fu; Bin Deng; Edward Seng; Marc Hutner; Jean-Francois Cote; Geir Eide (ITC-Asia, 2021)