Evaluation of a micropackaging analysis technique by highfrequency microwaves. - Geneviève Duchamp; Yves Ousten; Yves Danto (Microelectron. Reliab., 2002)

Reliability of Low-Cost PCB Interconnections for Telecommunication Applications. - Geneviève Duchamp; Frédéric Verdier; Yannick Deshayes; François Marc; Yves Ousten; Yves Danto (Microelectron. Reliab., 2004)

Near-field EMC study to improve electronic component reliability. - Geneviève Duchamp; D. Castagnet; Alain Meresse (Microelectron. Reliab., 2007)

Electromagnetic immunity model of an ADC for microcontroller's reliability improvement. - Jean-Baptiste Gros; Geneviève Duchamp; Alain Meresse; Jean-Luc Levant (Microelectron. Reliab., 2009)

Control of the electromagnetic compatibility: An issue for IC reliability. - Jean-Baptiste Gros; Geneviève Duchamp; Jean-Luc Levant; Christian Marot (Microelectron. Reliab., 2011)

A methodological approach for predictive reliability: Practical case studies. - Hélène Frémont; Geneviève Duchamp; Alexandrine Guédon-Gracia; Frédéric Verdier (Microelectron. Reliab., 2012)

Conducted immunity of three Op-Amps using the DPI measurement technique and VHDL-AMS modeling. - Siham Hairoud; Tristan Dubois; Angelique Tetelin; Geneviève Duchamp (EMC Compo, 2013)

Qualification procedure for moisture in embedded capacitors. - Hélène Frémont; Jörg Kludt; Massar Wade; Kirsten Weide-Zaage; Isabelle Bord-Majek; Geneviève Duchamp (Microelectron. Reliab., 2014)

Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements. - Ala Ayed; Tristan Dubois; Jean-Luc Levant; Geneviève Duchamp (Microelectron. Reliab., 2015)

Characterization and model of temperature effect on the conducted immunity of Op-Amp. - Tristan Dubois; Siham Hairoud; Marcio Hermany Gomes de Oliveira; Hélène Frémont; Geneviève Duchamp (Microelectron. Reliab., 2015)

A New Method for the Characterization of Electronic Components Immunity. - Ala Ayed; Tristan Dubois; Jean-Luc Levant; Geneviève Duchamp (IEEE Trans. Instrum. Meas., 2015)

Effects of ageing on the conducted immunity of a voltage reference: Experimental study and modelling approach. - S. Hairoud-Airieau; Geneviève Duchamp; Tristan Dubois; Jean-Yves Delétage; André Durier; Hélène Frémont (Microelectron. Reliab., 2017)

Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale. - M. Girard; Tristan Dubois; Patrick Hoffmann; Geneviève Duchamp (Microelectron. Reliab., 2018)

Susceptibility of an Analog Temperature Measurement Function: First Step to Optimize the IEMI Waveform. - Antoine Duguet; Tristan Dubois; Geneviève Duchamp; David Hardy; Franck Salvador (EMC Compo, 2024)

Investigation Into the Moisture Degradation Mechanism of Integrated Stacks Using New Moisture Sensor Design. - B. Ayoub; G. Imbert; F. Belfis; T. Parrassin; Sébastien Gallois-Garreignot; L. Mischler; Geneviève Duchamp; Hélène Frémont (IRPS, 2025)