Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits. - Geng Hu; Hong Wang; Shiyuan Yang (IEICE Trans. Inf. Syst., 2008)

From WSI-level to Patch-level: Structure Prior Guided Binuclear Cell Fine-grained Detection. - Baomin Wang; Geng Hu; Dan Chen; Lihua Hu; Cheng Li; Yu An; Guiping Hu; Guang Jia (CoRR, 2022)

From WSI-level to patch-level: Structure prior-guided binuclear cell fine-grained detection. - Geng Hu; Baomin Wang; Boxian Hu; Dan Chen; Lihua Hu; Cheng Li; Yu An; Guiping Hu; Guang Jia (Medical Image Anal., 2023)