The development of bipolar log domain filters in a standard CMOS process. - Geoffrey D. Duerden; Gordon W. Roberts; M. Jamal Deen (ISCAS (1), 2001)

A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. - Mohamed M. Hafed; Antonio H. Chan; Geoffrey D. Duerden; Bardia Pishdad; Clarence Tam; Sébastien Laberge; Gordon W. Roberts (ITC, 2004)