Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system. - Georg Haberfehlner; Sergey Bychikhin; Viktor Dubec; Michael Heer; A. Podgaynaya; M. Pfost; Matthias Stecher; Erich Gornik; Dionyz Pogany (Microelectron. Reliab., 2009)

Investigation of smart power DMOS devices under repetitive stress conditions using transient thermal mapping and numerical simulation. - Sergey Bychikhin; Georg Haberfehlner; J. Rhayem; Daniel Vanderstraeten; Renaud Gillon; Dionyz Pogany (Microelectron. Reliab., 2010)

Electro-thermal characterization and simulation of integrated multi-trenched XtreMOSTM power devices. - J. Rhayem; B. Besbes; Raul Blecic; Sergey Bychikhin; Georg Haberfehlner; Dionyz Pogany; B. Desoete; Renaud Gillon; Aarnout Wieers; Marnix Tack (Microelectron. J., 2012)