Hot-carrier reliability in high-voltage lateral double-diffused MOS transistors. - Verena Vescoli; Jong Mun Park; Hubert Enichlmair; Martin Knaipp; Georg Röhrer; Rainer Minixhofer; Martin Schrems (IET Circuits Devices Syst., 2008)

Vacuum-assisted selective adhesive imprinting for heterogeneous system integration of MOEMS devices : Automated assembly of miniaturized PM sensor. - Jaka Pribosek; Markus Zauner; Jochen Bardong; Alfred Binder; Paul Maierhofer; Alexander Bergmann; Georg Röhrer (IEEE SENSORS, 2019)