Performance, reliability, radiation effects, and aging issues in microelectronics - from atomic-scale physics to engineering-level modeling. - Sokrates T. Pantelides; L. Tsetseris; M. J. Beck; Sergey N. Rashkeev; George Hadjisavvas; I. G. Batyrev; B. R. Tuttle; A. G. Marinopoulos; X. J. Zhou; Daniel M. Fleetwood; Ronald D. Schrimpf (ESSCIRC, 2009)