Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. - Felix Beaudoin; Gérald Haller; Philippe Perdu; Romain Desplats; Thomas Beauchêne; Dean Lewis (Microelectron. Reliab., 2002)

Backside Hot Spot Detection Using Liquid Crystal Microscopy. - Olivier Crépel; Felix Beaudoin; Lionel Dantas de Morais; Gérald Haller; C. Goupil; Philippe Perdu; Romain Desplats; Dean Lewis (Microelectron. Reliab., 2002)

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. - Felix Beaudoin; Romain Desplats; Philippe Perdu; Abdellatif Firiti; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2003)

Short defect characterization based on TCR parameter extraction. - Abdellatif Firiti; D. Faujour; Gérald Haller; J. M. Moragues; Vincent Goubier; Philippe Perdu; Felix Beaudoin; Dean Lewis (Microelectron. Reliab., 2003)

Magnetic Microscopy for IC Failure Analysis: Comparative Case Studies using SQUID, GMR and MTJ systems. - Olivier Crépel; Patrick Poirier; Philippe Descamps; Romain Desplats; Philippe Perdu; Gérald Haller; Abdellatif Firiti (Microelectron. Reliab., 2004)

Understanding the effects of NIR laser stimulation on NMOS transistor. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2004)

Automated Diagnosis and Probing Flow for Fast Fault Localization in IC. - D. Martin; Romain Desplats; Gérald Haller; Pascal Nouet; Florence Azaïs (Microelectron. Reliab., 2004)

Impact of semiconductors material on IR Laser Stimulation signal. - Abdellatif Firiti; Felix Beaudoin; Gérald Haller; Philippe Perdu; Dean Lewis; Pascal Fouillat (Microelectron. Reliab., 2005)

Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. - Nicolas Rodriguez 001; Jérôme Adrian; Catherine Grosjean; Gérald Haller; Christophe Girardeaux; Alain Portavoce (Microelectron. Reliab., 2006)

Investigation of a new method for dopant characterization. - Jérôme Adrian; Nicolas Rodriguez 001; Fabien Essely; Gérald Haller; Catherine Grosjean; Alain Portavoce; Christophe Girardeaux (Microelectron. Reliab., 2007)

Generic simulator for faulty IC. - Julie Ferrigno; Aziz Machouat; Philippe Perdu; Dean Lewis; Gérald Haller; Vincent Goubier (Microelectron. Reliab., 2008)

Effect of physical defect on shmoos in CMOS DSM technologies. - Aziz Machouat; Gérald Haller; Vincent Goubier; Dean Lewis; Philippe Perdu; Vincent Pouget; Pascal Fouillat; Fabien Essely (Microelectron. Reliab., 2008)

Net integrity checking by optical localization techniques. - Gérald Haller; Aziz Machouat; Dean Lewis; Vincent Pouget (Microelectron. Reliab., 2009)

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory. - Roxane Llido; J. Gomez; Vincent Goubier; N. Froidevaux; L. Dufayard; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2011)

Effects of 1064 nm laser on MOS capacitor. - R. Llido; Pascal Masson; Arnaud Régnier; Vincent Goubier; Gérald Haller; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2012)