Impact of TCAD model parameters on optical and electrical characteristics of radiation-hard photodiode in 0.35bm CMOS technology. - Filip Segmanovic; Frederic Roger; Gerald Meinhardt; Ingrid Jonak-Auer; Tomislav Suligoj (MIPRO, 2018)

Optical and Electrical Simulations of Radiation-Hard Photodiode in 0.35μM High-Voltage CMOS Technology. - Filip Segmanovic; Frederic Roger; Gerald Meinhard; Ingrid Jonak-Auer; Tomislav Suligoj (PATMOS, 2018)

PIN-photodiode based active pixel in 0.35 μm high-voltage CMOS for optical coherence tomography. - Marko Vlaskovic; Horst Zimmermann; Gerald Meinhardt; Jochen Kraft; Martin Sagmeister; Johannes Schoegler (MIPRO, 2019)