Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products. - Gerald Neumann; J. Touzel; Rainer Duschl (Microelectron. Reliab., 2005)

Advanced thermal failure analysis and reliability investigations - Industrial demands and related limitations. - Andreas Altes; Rainer Tilgner; Markus Reissner; Grazyna Steckert; Gerald Neumann (Microelectron. Reliab., 2008)

Datenzentren für die nachhaltige Forschung in den Digital Humanities. - Patrick Sahle; Thorsten Trippel; Gerald Neumann; Claudia Engelhardt; Daniel Kurzawe; Felix Schäfer; Kai Wörner (DHd, 2016)