Corrosion and protection of thin-line conductors in VLSI structures. - Vlasta Brusic; Gerald S. Frankel; Chao-Kyn Hu; Miro M. Plechaty; Geraldine Cogin Schwartz (IBM J. Res. Dev., 1993)

Application of X-ray spectroscopy to the study of electrochemically formed surface oxide films. - Alejandro G. Schrott; Gerald S. Frankel (IBM J. Res. Dev., 1993)

Statistical Modeling of Minimum Intergranular Corrosion Path Length in High-Strength Aluminum Alloy. - Shiling Ruan; Douglas A. Wolfe; Weilong Zhang; Gerald S. Frankel (Technometrics, 2004)