Reliability of power electronic devices against cosmic radiation-induced failure. - Gerald Sölkner; Winfried Kaindl; Hans-Joachim Schulze; Gerhard K. M. Wachutka (Microelectron. Reliab., 2004)

Ensuring the reliability of power electronic devices with regard to terrestrial cosmic radiation. - Gerald Sölkner (Microelectron. Reliab., 2016)