A yield improvement technique for IC layout using local design rules. - Gerard A. Allan; Anthony J. Walton; Robert J. Holwill (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1992)

Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. - Gerard A. Allan; Anthony J. Walton (DFT, 1994)

Hierarchical critical area extraction with the EYE tool. - Gerard A. Allan; Anthony J. Walton (DFT, 1995)

Critical area extraction of extra material soft faults. - Gerard A. Allan; Anthony J. Walton (DFT, 1995)

Yield Prediction by Sampling with the EYES Tool. - Gerard A. Allan; Anthony J. Walton (DFT, 1996)

Application of a Survey Sampling Critical Area Computation Tool in a Manufacturing Environment. - Frederic Duvivier; Gerard A. Allan (DFT, 1996)

Integration of DFM Techniques and Design Automation. - Thomas G. Waring; Gerard A. Allan; Anthony J. Walton (DFT, 1996)

Efficient critical area estimation for arbitrary defect shapes. - Gerard A. Allan; Anthony J. Walton (DFT, 1997)

A Comparison of Efficient Dot Throwing and Shape Shifting Extra Material Critical Area Estimation. - Gerard A. Allan (DFT, 1998)

Efficient extra material critical area algorithms. - Gerard A. Allan; Anthony J. Walton (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

IC Critical Volume Calculation through Ray-Casting of CSG Trees. - Mike Moran; Gerard A. Allan (DFT, 2000)

Yield prediction by sampling IC layout. - Gerard A. Allan (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000)