: Modeling and Test Point Selection for Data Converter Testing. - Gerard N. Stenbakken; T. Michael Souders (ITC, 1985)

A comprehensive approach for modeling and testing analog and mixed-signal devices. - T. Michael Souders; Gerard N. Stenbakken (ITC, 1990)

Linear Error Modeling of Analog and Mixed-Signal Devices. - Gerard N. Stenbakken; T. Michael Souders (ITC, 1991)

A fast-pulse oscilloscope calibration system. - John P. Deyst; Nicholas G. Paulter Jr.; Tamás Dabóczi; Gerard N. Stenbakken; T. Michael Souders (IEEE Trans. Instrum. Meas., 1998)

Comparison of time base nonlinearity measurement techniques. - Gerard N. Stenbakken; John P. Deyst (IEEE Trans. Instrum. Meas., 1998)

Time-base nonlinearity determination using iterated sine-fit analysis. - Gerard N. Stenbakken; John P. Deyst (IEEE Trans. Instrum. Meas., 1998)

Nonrandom quantization errors in timebases. - Gerard N. Stenbakken; Dong Liu; Janusz A. Starzyk; Bryan C. Waltrip (IEEE Trans. Instrum. Meas., 2001)

Improved time-base for waveform parameter estimation. - Bryan C. Waltrip; Owen B. Laug; Gerard N. Stenbakken (IEEE Trans. Instrum. Meas., 2001)

Empirical modeling methods using partial data. - Gerard N. Stenbakken; Hung-kung Liu (IEEE Trans. Instrum. Meas., 2004)

Phase-plane-derived distortion modeling of a fast and accurate digitizing sampler. - David I. Bergman; Gerard N. Stenbakken (IEEE Trans. Instrum. Meas., 2006)

Calibration of Phasor Measurement Unit at NIST. - Yi-Hua Tang; Gerard N. Stenbakken; Allen Goldstein (IEEE Trans. Instrum. Meas., 2013)