Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. - Sergey Bychikhin; Martin Litzenberger; R. Pichler; Dionyz Pogany; Erich Gornik; Gerhard Groos; Matthias Stecher (Microelectron. Reliab., 2001)

Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method. - M. Blaho; Dionyz Pogany; Erich Gornik; Marie Denison; Gerhard Groos; Matthias Stecher (Microelectron. Reliab., 2003)

Multiple-time-instant 2D thermal mapping during a single ESD event. - Viktor Dubec; Sergey Bychikhin; M. Blaho; Michael Heer; Dionyz Pogany; Marie Denison; Nils Jensen; Matthias Stecher; Gerhard Groos; Erich Gornik (Microelectron. Reliab., 2004)

Automated setup for thermal imaging and electrical degradation study of power DMOS devices. - Michael Heer; Viktor Dubec; M. Blaho; Sergey Bychikhin; Dionyz Pogany; Erich Gornik; Marie Denison; Matthias Stecher; Gerhard Groos (Microelectron. Reliab., 2005)

Characterisation method for chip card ESD events causing terminal failures. - Gerhard Groos (Microelectron. Reliab., 2012)

Transient analysis of latent damage formation in SMD capacitors by Transmission Line Pulsing (TLP). - Dennis Helmut; Gerhard K. M. Wachutka; Gerhard Groos (Microelectron. Reliab., 2017)