GaN virtual prototyping: From traps modeling to system-level cascode optimization. - Gilberto Curatola; Andreas Kassmanhuber; Sergey Yuferev; Jörg Franke; Gianmauro Pozzovivo; Simone Lavanga; Gerhard Prechtl; Thomas Detzel; Oliver Haeberlen (ESSDERC, 2014)

Charge Trapping in GaN Power Transistors: Challenges and Perspectives. - Matteo Meneghini; Nicola Modolo; Arianna Nardo; Carlo De Santi; Andrea Minetto; Luca Sayadi; Christian Koller; Sebastien Sicre; Gerhard Prechtl; Gaudenzio Meneghesso; Enrico Zanoni (BCICTS, 2021)

A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level. - Nicola Modolo; Andrea Minetto; Carlo De Santi; Luca Sayadi; Sebastien Sicre; Gerhard Prechtl; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (IRPS, 2021)

Modeling Hot-Electron Trapping in GaN-based HEMTs. - Nicola Modolo; Carlo De Santi; Andrea Minetto; Luca Sayadi; Sebastien Sicre; Gerhard Prechtl; Gaudenzio Meneghesso; Enrico Zanoni; Matteo Meneghini (IRPS, 2022)