A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology. - Wafa Arfaoui; Germain Bossu; A. Muehlhoff; D. Lipp; R. Manuwald; T. Chen; Tanya Nigam; Mahesh Siddabathula (IRPS, 2020)

Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. - Maria Toledano-Luque; Peter C. Paliwoda; Mohamed Nour; Thomas Kauerauf; Byoung Min; Germain Bossu; Mahesh Siddabathula; Tanya Nigam (IRPS, 2021)

Reliability-Conscious MOSFET Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection. - Pratik B. Vyas; Ninad Pimparkar; Robert Tu; Wafa Arfaoui; Germain Bossu; Mahesh Siddabathula; Steffen Lehmann; Jung-Suk Goo; Ali B. Icel (IRPS, 2021)

22FDX™ 5G 28GHz 20dBm Power Amplifier Constant Load and VSWR accelerated aging reliability. - Germain Bossu; Shafi Syed; S. Evseev; Joris Angelo Sundaram Jerome; Wafa Arfaoui; D. Lipp; Mahesh Siddabathula (IRPS, 2022)

Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications. - D. Lipp; Z. Zhao; G. Krause; Wafa Arfaoui; Elodie Ebrard; Germain Bossu; S. Evseev; Markus Herklotz; Mahesh Siddabathula (IRPS, 2023)