Saliency-Guided Transformer Attention With Pixel-Level Contrastive Learning for Weakly Supervised Defect Localization. - Dejene M. Sime; Nan Ouyang; Kai Sheng; Getu T. Fellek; Wenkang Wan; Adnan A. Qaseem; Xiaojiang Ren; Shehui Bu (IEEE Trans. Ind. Informatics, 2026)