A 10-Bit 40-MS/s Pipelined ADC With a Wide Range Operating Temperature for WAVE Applications. - Ghil-Geun Oh; Chang-Kyo Lee; Seung-Tak Ryu (IEEE Trans. Circuits Syst. II Express Briefs, 2014)

Advanded Design Verification and Debugging Techniques Based on Optical Fault Isolation Method. - Ghil-Geun Oh; Jong-Ho Eun; Shin-Young Chung; Brandon Lee (ISOCC, 2019)

Cost-Effective Test Method for screening out Unexpected Failure in High Speed Serial Interface IPs. - Sang-Uck Ahn; Beom-Kyu Seo; Hyun-Woo Kim; Yeoun-Sook Shin; Hyung-Tae Kim; Ghil-Geun Oh; Young-Dae Kim (ITC, 2020)

Dynamic Voltage Stress Sensing Circuits for Screening Out Early Device Reliability Issues in Advanced Technology Nodes. - Ghil-Geun Oh; Min-Hye Ho; Yeon-Jung Shin; Jaewook Choi; Ju-Youn Kim; Young-Dae Kim (A-SSCC, 2021)