An RT-level fault model with high gate level correlation. - Fulvio Corno; Gianluca Cumani; Matteo Sonza Reorda; Giovanni Squillero (HLDVT, 2000)

Effective Techniques for High-Level ATPG. - Fulvio Corno; Gianluca Cumani; Matteo Sonza Reorda; Giovanni Squillero (Asian Test Symposium, 2001)

ARPIA: A High-Level Evolutionary Test Signal Generator. - Fulvio Corno; Gianluca Cumani; Matteo Sonza Reorda; Giovanni Squillero (EvoWorkshops, 2001)

Evolutionary Test Program Induction for Microprocessor Design Verification. - Fulvio Corno; Gianluca Cumani; Matteo Sonza Reorda; Giovanni Squillero (Asian Test Symposium, 2002)

Efficient machine-code test-program induction. - Fulvio Corno; Gianluca Cumani; Matteo Sonza Reorda; Giovanni Squillero (IEEE Congress on Evolutionary Computation, 2002)

Automatic Test Program Generation from RT-Level Microprocessor Descriptions. - Fulvio Corno; Gianluca Cumani; Matteo Sonza Reorda; Giovanni Squillero (ISQED, 2002)

Fully Automatic Test Program Generation for Microprocessor Cores. - Fulvio Corno; Gianluca Cumani; Matteo Sonza Reorda; Giovanni Squillero (DATE, 2003)

Automatic Test Program Generation for Pipeline Processors. - Fulvio Corno; Gianluca Cumani; Matteo Sonza Reorda; Giovanni Squillero (SAC, 2003)