Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress. - F. V. Farmakis; Giannis P. Kontogiannopoulos; Dimitrios N. Kouvatsos; Apostolos T. Voutsas (Microelectron. Reliab., 2007)

On the importance of the Vg, max-Vth parameter on LTPS TFT stressing behavior. - Despina C. Moschou; Giannis P. Kontogiannopoulos; Dimitrios N. Kouvatsos; Apostolos T. Voutsas (Microelectron. Reliab., 2010)