Practical solutions for the application of the oscillation-based-test in analog integrated circuits. - Diego Vázquez; Gloria Huertas; Gildas Léger; Adoración Rueda; José L. Huertas (ISCAS (1), 2002)

Low-cost on-chip measurements for Oscillation-Based-Test in Analog Integrated Circuits. - Diego Vázquez; Gloria Huertas; Adoración Rueda; Gildas Léger; José L. Huertas (LATW, 2002)

Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation. - Diego Vázquez; Gloria Huertas; Gildas Léger; Adoración Rueda; José L. Huertas (VTS, 2002)

A Digital Test for First-Order [Sigma-Delta] Modulators. - Gildas Léger; Adoración Rueda (DATE, 2004)

A Method for Parameter Extraction of Analog Sine-Wave Signals for Mixed-Signal Built-In-Self-Test Applications. - Diego Vázquez; Gildas Léger; Gloria Huertas; Adoración Rueda; José L. Huertas (DATE, 2004)

Impact of random channel mismatch on the SNR and SFDR of time-interleaved ADCs. - Gildas Léger; Eduardo J. Peralías; Adoración Rueda; José Luis Huertas (IEEE Trans. Circuits Syst. I Regul. Pap., 2004)

Sine-Wave Signal Characterization Using Square-Wave and SigmaDelta-Modulation: Application to Mixed-Signal BIST. - Diego Vázquez; Gloria Huertas; África Luque; Manuel J. Barragan Asian; Gildas Léger; Adoración Rueda; José Luis Huertas (J. Electron. Test., 2005)

A tissue impedance measurement chip for myocardial ischemia detection. - Alberto Yufera; Adoración Rueda; José Maria Muñoz; Ricardo Doldán; Gildas Léger; Esther Rodríguez-Villegas (IEEE Trans. Circuits Syst. I Regul. Pap., 2005)

Experimental Validation of a Fully Digital BISTfor Cascaded Sigma Delta Modulators. - Gildas Léger; Adoración Rueda (ETS, 2006)

Low-Cost Digital Detection of Parametric Faults in Cascaded SigmaDelta Modulators. - Gildas Léger; Adoración Rueda (IEEE Trans. Circuits Syst. I Regul. Pap., 2009)

On Chopper Effects in Discrete-Time SigmaDelta Modulators. - Gildas Léger; Antonio J. Ginés; Eduardo J. Peralías; Adoración Rueda (IEEE Trans. Circuits Syst. I Regul. Pap., 2010)

Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs. - Manuel J. Barragan Asian; Rafaella Fiorelli; Gildas Léger; Adoración Rueda; José L. Huertas (Asian Test Symposium, 2011)

Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures. - Manuel J. Barragan Asian; Rafaella Fiorelli; Gildas Léger; Adoración Rueda; José L. Huertas (J. Electron. Test., 2011)

OBT for settling error test of sampled-data systems using signal-dependent clocking. - Manuel J. Barragan Asian; Gildas Léger; José L. Huertas (ETS, 2012)

Multi-condition alternate test of analog, mixed-signal, and RF systems. - Manuel J. Barragan Asian; Gildas Léger; José Luis Huertas (LATW, 2012)

Efficient selection of signatures for analog/RF alternate test. - Manuel J. Barragan Asian; Gildas Léger (ETS, 2013)

Sinusoidal signal generation for mixed-signal BIST using a harmonic-cancellation technique. - Manuel J. Barragán; Gildas Léger; Diego Vázquez; Adoración Rueda (LASCAS, 2013)

Sigma-delta testability for pipeline A/D converters. - Antonio J. Ginés; Gildas Léger (DATE, 2014)

Doubly-segmented current-steering DAC calibration. - Gildas Léger (DTIS, 2014)

Closed-loop simulation method for evaluation of static offset in discrete-time comparators. - Antonio J. Ginés; Eduardo J. Peralías; Gildas Léger; Adoración Rueda (ICECS, 2014)

Feature selection for alternate test using wrappers: application to an RF LNA case study. - Manuel J. Barragán; Gildas Léger (DATE, 2015)

Combining adaptive alternate test and multi-site. - Gildas Léger (DATE, 2015)

Boundary cost optimization for Alternate Test. - Gildas Léger (ETS, 2015)

Special session: Hot topics: Statistical test methods. - Manuel J. Barragán; Gildas Léger; Florence Azaïs; Ronald D. Blanton; Adit D. Singh; Stephen Sunter (VTS, 2015)

A Procedure for Alternate Test Feature Design and Selection. - Manuel J. Barragan Asian; Gildas Léger (IEEE Des. Test, 2015)

Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator. - Antonio J. Ginés; Eduardo J. Peralías; Gildas Léger; Adoración Rueda; Guillaume Renaud; Manuel J. Barragán; Salvador Mir (ETS, 2016)

Questioning the reliability of Monte Carlo simulation for machine learning test validation. - Gildas Léger; Manuel J. Barragán (ETS, 2016)

Guest Editorial: Analog, Mixed-Signal and RF Testing. - Gildas Léger; Carsten Wegener (J. Electron. Test., 2016)

Brownian distance correlation-directed search: A fast feature selection technique for alternate test. - Gildas Léger; Manuel J. Barragán (Integr., 2016)

On the limits of machine learning-based test: A calibrated mixed-signal system case study. - Manuel J. Barragán; Gildas Léger; Antonio J. Ginés; Eduardo J. Peralías; Adoración Rueda (DATE, 2017)

Single Event Transient injection in large mixed-signal circuits. - Valentin Gutierrez; Gildas Léger (DCIS, 2018)

AMS-RF test quality: Assessing defect severity. - Valentin Guiterrez; Antonio J. Ginés; Gildas Léger (IOLTS, 2018)

Mixed-signal test automation: Are we there yet? - Gildas Léger; Manuel J. Barragán (ISCAS, 2018)

On the use of causal feature selection in the context of machine-learning indirect test. - Manuel J. Barragán; Gildas Léger; Florent Cilici; Estelle Lauga-Larroze; Sylvain Bourdel; Salvador Mir (DATE, 2019)

SET sensitivity evaluation, a comparison before and after layout. - Valentin Gutierrez; Gildas Léger (DCIS, 2019)

Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration. - Florent Cilici; Manuel J. Barragán; Salvador Mir; Estelle Lauga-Larroze; Sylvain Bourdel; Gildas Léger (ISCAS, 2019)

Feature selection and feature design for machine learning indirect test: a tutorial review. - Manuel J. Barragán; Gildas Léger (SMACD, 2019)

Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits. - Florent Cilici; Gildas Léger; Manuel J. Barragán; Salvador Mir; Estelle Lauga-Larroze; Sylvain Bourdel (SMACD, 2019)

1 Adaptive defect simulation flow for Defect-oriented Test evaluation. - Valentin Gutierrez; Gildas Léger (SMACD, 2019)

Non-Linear Calibration of Pipeline ADCs using a Histogram-Based Estimation of the Redundant INL. - Antonio J. Ginés; Gildas Léger; Eduardo J. Peralías (NEWCAS, 2020)

On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits. - Valentin Gutierrez; Gildas Léger (NEWCAS, 2020)

An adaptive simulation framework for AMS-RF test quality. - Valentin Gutierrez; Gildas Léger (Integr., 2020)

Digital Non-Linearity Calibration for ADCs With Redundancy Using a New LUT Approach. - Antonio J. Ginés; Gildas Léger; Eduardo J. Peralías (IEEE Trans. Circuits Syst. I Regul. Pap., 2021)

Special Session on RF/5G Test. - William R. Eisenstadt; Mark Roos; Devin Morris; José Luis González-Jiménez; Christopery Mounet; Manuel J. Barragán; Gildas Léger; Florent Cilici; Estelle Lauga-Larroze; Salvador Mir; Sylvain Bourdel; Marc Margalef-Rovira; et al. (ETS, 2022)

A methodology for defect detection in analog circuits based on causal feature selection. - Gildas Léger; Antonio J. Ginés; Valentin Gutierrez; Manuel J. Barragán (ICECS 2022, 2022)

Self-Healing of Redundant FLASH ADCs. - Hala Youssef Darweesh; Càndid Reig; Gildas Léger (IEEE Des. Test, 2022)

A Single-Event Latchup setup for high-precision AMS circuits. - Gildas Léger; Antonio J. Ginés; Eduardo J. Peralías; Valentin Gutierrez; Carlos M. Domínguez-Matas; Maria Angeles Jalón; L. Carranza (ETS, 2023)

Behavioral Model for High-Speed SAR ADCs With On-Chip References. - Carlos Manuel Domínguez-Matas; Antonio J. Ginés; Aránzazu Otín; Valentin Gutierrez; Gildas Léger; Eduardo J. Peralías (IEEE Trans. Very Large Scale Integr. Syst., 2023)

On the Validity of SEE Simulation for Rad-Hard Analog ASICs. - Valentin Gutierrez; Carlos M. Domínguez-Matas; Gildas Léger; Antonio J. Ginés; Eduardo J. Peralías (IOLTS, 2025)