Growing Interest of Advanced Commercial CMOS Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened SRAM in 130nm CMOS. - Philippe Roche; Mark Lysinger; Gilles Gasiot; Jean-Marc Daveau; Mehdi Zamanian; Pierre Dautriche (IOLTS, 2008)

Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level. - Jean-Luc Autran; Daniela Munteanu; Philippe Roche; Gilles Gasiot; S. Martinie; S. Uznanski; S. Sauze; S. Semikh; Evgeny Yakushev; S. Rozov; Pia Loaiza; G. Warot; et al. (Microelectron. Reliab., 2010)

A 65nm SRAM achieving 250mV retention and 350mV, 1MHz, 55fJ/bit access energy, with bit-interleaved radiation Soft Error tolerance. - Sylvain Clerc; Fady Abouzeid; Gilles Gasiot; David Gauthier; Philippe Roche (ESSCIRC, 2012)

A 0.32V, 55fJ per bit access energy, CMOS 65nm bit-interleaved SRAM with radiation Soft Error tolerance. - Sylvain Clerc; Fady Abouzeid; Gilles Gasiot; David Gauthier; Dimitri Soussan; Philippe Roche (ICICDT, 2012)

Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits. - Jean-Luc Autran; Maximilien Glorieux; Daniela Munteanu; Sylvain Clerc; Gilles Gasiot; Philippe Roche (Microelectron. Reliab., 2014)

Real-time soft-error rate measurements: A review. - Jean-Luc Autran; Daniela Munteanu; Philippe Roche; Gilles Gasiot (Microelectron. Reliab., 2014)

28nm FD-SOI technology and design platform for sub-10pJ/cycle and SER-immune 32bits processors. - Fady Abouzeid; Sylvain Clerc; Cyril Bottoni; Benjamin Coeffic; Jean-Marc Daveau; Damien Croain; Gilles Gasiot; Dimitri Soussan; Philippe Roche (ESSCIRC, 2015)

Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test. - Cyril Bottoni; Benjamin Coeffic; Jean-Marc Daveau; Gilles Gasiot; Fady Abouzeid; Sylvain Clerc; Lirida A. B. Naviner; Philippe Roche (IRPS, 2015)

Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs. - Gilles Gasiot; Dimitri Soussan; Jean-Luc Autran; Victor Malherbe; Philippe Roche (IRPS, 2015)

Alpha soft error rate of FDSOI 28 nm SRAMs: Experimental testing and simulation analysis. - Victor Malherbe; Gilles Gasiot; Dimitri Soussan; Aurelien Patris; Jean-Luc Autran; Philippe Roche (IRPS, 2015)

ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure. - Jean-Luc Autran; Daniela Munteanu; Soilihi Moindjie; Tarek Saad Saoud; S. Sauze; Gilles Gasiot; Philippe Roche (Microelectron. Reliab., 2015)

30% static power improvement on ARM Cortex®-A53 using static biasing-anticipation. - Fady Abouzeid; Christophe Bernicot; Sylvain Clerc; Jean-Marc Daveau; Gilles Gasiot; Daniel Noblet; Dimitri Soussan; Philippe Roche (ESSCIRC, 2016)

Multi-Poisson process analysis of real-time soft-error rate measurements in bulk 65 nm and 40 nm SRAMs. - Soilihi Moindjie; Jean-Luc Autran; Daniela Munteanu; Gilles Gasiot; Philippe Roche (Microelectron. Reliab., 2017)