Industrial best practice: cases of study by automotive chip- makers. - L. Degli Abbati; Rudolf Ullmann; G. Paganini; M. Coppetta; L. Zaia; Vincent Huard; O. Montfort; Riccardo Cantoro; Giorgio Insinga; F. Venini; P. Calao; Paolo Bernardi (DFT, 2021)

Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. - Paolo Bernardi; Giorgio Insinga; G. Paganini; Riccardo Cantoro; P. Beer; M. Coppetta; N. Mautone; G. Carnevale; Pierre Scaramuzza; Rudolf Ullmann (ETS, 2022)

Recent Trends and Perspectives on Defect-Oriented Testing. - Paolo Bernardi; Riccardo Cantoro; Anthony Coyette; W. Dobbeleare; Moritz Fieback; Andrea Floridia; G. Gielenk; Jhon Gomez; Michelangelo Grosso; Andrea Guerriero; Iacopo Guglielminetti; Said Hamdioui; et al. (IOLTS, 2022)

Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. - Giorgio Insinga; M. Battilana; M. Coppetta; N. Mautone; G. Carnevale; M. Giltrelli; Pierre Scaramuzza; Rudolf Ullmann (ETS, 2023)

Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests. - Paolo Bernardi; Gabriele Filipponi; Tommaso Foscale; Giorgio Insinga (LATS, 2023)

A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test. - Paolo Bernardi; Giorgio Insinga; Nima Kolahimahmoudi (VLSI-SoC, 2023)

A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements. - Nima Kolahimahmoudi; Giorgio Insinga; Stefano Roggi; Josef Niederl; Paolo Bernardi (DTTIS, 2024)

Late Breaking Results: A Data Compaction Strategy for Extensive Test Flows of Memories Embedded in Automotive SoCs. - Paolo Bernardi; B. Borio; Giorgio Insinga; B. Mendicino; M. Battilana; M. Coppetta; N. Mautone; Pierre Scaramuzza; F. Tengler; Rudolf Ullmann (DATE, 2025)

Test and diagnosis of memories embedded in Automotive SoCs. - Giorgio Insinga (2025)