Road Signs Recognition Using a Dynamic Pixel Aggregation Technique in the HSV Color Space. - Salvatore Vitabile; Giorgio Pollaccia; Giovanni Pilato; Filippo Sorbello (ICIAP, 2001)

A low-ripple voltage tripler. - Ferdinando Bedeschi; Chiara Boffino; Edoardo Bonizzoni; Osama Khouri; Giorgio Pollaccia; Claudio Resta; Guido Torelli (ISCAS, 2006)

A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC. - Davide Appello; Paolo Bernardi; G. Giacopelli; Alessandro Motta; Alberto Pagani; Giorgio Pollaccia; C. Rabbi; Marco Restifo; P. Ruberg; Ernesto Sánchez 001; C. M. Villa; Federico Venini (DATE, 2017)

An Optimized Test During Burn-In for Automotive SoC. - Davide Appello; Conrad Bugeja; Giorgio Pollaccia; Paolo Bernardi; Riccardo Cantoro; Marco Restifo; Ernesto Sánchez 001; Federico Venini (IEEE Des. Test, 2018)

Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC. - Davide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Giorgio Pollaccia; Marco Restifo; Federico Venini (J. Electron. Test., 2018)

An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. - Davide Appello; Paolo Bernardi; Conrad Bugeja; Riccardo Cantoro; Andrea Colazzo; Alessandro Motta; Alberto Pagani; Giorgio Pollaccia; Marco Restifo; Ernesto Sánchez 001; Federico Venini (J. Low Power Electron., 2018)

Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. - F. Almeida; Paolo Bernardi; D. Calabrese; Marco Restifo; Matteo Sonza Reorda; Davide Appello; Giorgio Pollaccia; Vincenzo Tancorre; Roberto Ugioli; Gulio Zoppi (DDECS, 2019)

Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. - Davide Appello; Paolo Bernardi; Andrea Calabrese; Stefano Littardi; Giorgio Pollaccia; Stefano Quer; Vincenzo Tancorre; Roberto Ugioli (DDECS, 2021)

Innovative methods for Burn-In related Stress Metrics Computation. - Walter Ruggeri; Paolo Bernardi; Stefano Littardi; Matteo Sonza Reorda; Davide Appello; Claudia Bertani; Giorgio Pollaccia; Vincenzo Tancorre; Roberto Ugioli (DTIS, 2021)

Parallel Multithread Analysis of Extremely Large Simulation Traces. - Davide Appello; Paolo Bernardi; Andrea Calabrese; Giorgio Pollaccia; Stefano Quer; Vincenzo Tancorre; Roberto Ugioli (IEEE Access, 2022)

A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. - Francesco Angione; Davide Appello; Paolo Bernardi; Claudia Bertani; Giovambattista Gallo; Stefano Littardi; Giorgio Pollaccia; Walter Ruggeri; Matteo Sonza Reorda; Vincenzo Tancorre; Roberto Ugioli (IEEE Trans. Computers, 2023)